Quality Magazine
  Home
  Subscribe
  Subscribe to eNewsletter
  Subscription Customer Service
  Online
  Industry Headlines
  eXtras
  Blogs
  Quality Product Spotlights
  White Papers on the Web
  Tech ManufactureXPO
  Quality Downloads
  Webinars
  Quality Showcases
  e-Inserts Plus
  Online Store
  More Product Info
  Archive
  Q-Tube
  Q-Cast Podcasts
  Quality Showrooms
  Brain Teasers
  Current Issue
  Coming Events
  Features
  Departments
  Columns
  Products
  Quality Quick Clicks
  Special Sections
  NDT
  Vision & Sensors
  Aerospace
  How To Guide
  China Editions
  Quality Guides
  Quality Buyers Guide
  Software Selector
  Registrars Guide
  Services Guide
  Quality Services
  Job Marketplace
  Industry Links
  Classifieds
  Career Center
  Events
  Quality Expo 2012
  IMTS 2012
  Meetings and Shows
  Industry Webinars
  Quality Awards
  2012 Quality Plant of the Year Nomination Form
  2012 Quality Professional of the Year Nomination Form
  Quality Leadership 100
  Quality Info
  Media Planning Guide
Search in: EditorialProductsCompanies
Nikon’s Small World Celebrates 30 years

December 1, 2004

ARTICLE TOOLS
EmailEmailPrintPrintReprintsReprintsshareShare



MELVILLE, NY—The Nikon 2004 Small World Photomicrography Competition celebrates 30 years. Nikon Instruments Inc., a microscope and digital imaging technology manufacturer, sponsors the annual contest to celebrate the possibilities of photography through microscopes. This year, the winners were unveiled October 6 at the Good Morning America studios in Times Square and will begin a museum tour across the country in January.

Lee Shuett, executive vice president of Nikon Instruments says, “The photographs featured in the gallery of art demonstrate scientific curiosity blended with extraordinary artistic sensibility.”

Out of 1,200 submitted images this year, 20 were selected for exhibition. This year’s first prize was awarded to Seth Coe-Sullivan from MIT’s department of electrical engineering and computer sciences in Cambridge, MA. Coe-Sullivan’s winning image was a 200X-zoomed quantum dot nanocrystals deposited on a silicon substrate.

Eric Flem, communications manager for the company says of the winning images, “These photos allow us to share in the special moments of discovery that spark scientific curiosity, and can serve as inspiration to aspiring scientists.”

The deadline for the 2005 Nikon Small World Photomicrography Competition is June 30, 2005. Anyone over 18 years of age is welcome to apply. Images can be sent in 35 mm format or digital images can be uploaded at MicroscopyU on Nikon’s Web site at www.nikonusa.com. For more information contact Nikon Small World, Nikon Instruments Inc., 1300 Walt Whitman Road, Melville, NY 11747 or call (631) 547-8569.



|PrintEmail

Did you enjoy this article? Click here to subscribe to the magazine.


























Most Emailed Articles

  1. Management: A Closer Look: Understanding Risk Management for Medical Device Manufacturers
  2. Auto Industry Goes on U.S. Hiring Binge
  3. Jim’s Gems: Don’t Focus on What Seems Unfair
  4. GD&T Workshop: A Top Down View
  5. Understanding ISO 13485
  6. Other Dimensions: Does New Stuff Have to be Calibrated?
  7. Software & Analysis: FMEAs for the Medical Industry: Which FMEA Type Should I Use?
  8. Face of Quality: Focus on the Vital Few
  9. Software & Analysis: FMEAs for the Medical Industry: Which FMEA Type Should I Use?
  10. Quality 101: Surface Finish Measurement Basics
Top Searches
  1. Quality 101
  2. variation management
  3. Quality Management Systems
  4. quality inspector
  5. root cause
  6. quality performance indicators
  7. quality assurance
  8. LEAN Quality Management Systems
  9. surface finish
  10. employee involvment
 
Most Popular Articles
  1. Measurement: The Democratization of Measurement 01/27/2012
  2. Test & Inspection: Sensing the Thread 01/30/2012
  3. U.S. Manufacturing Making a Comeback 02/01/2012
  4. Management: A Closer Look: Understanding Risk Management for Medical Device Manufacturers 01/03/2012
  5. Understanding ISO 13485 01/02/2008
  6. Quality 101: An Introduction to Gage R&R 12/01/2005
  7. Other Dimensions: Does New Stuff Have to be Calibrated? 01/31/2012
  8. Jim's Gems: Think Ahead 01/30/2012
  9. Quality Management 2.0: Deming's 7 Deadly Diseases of Management 01/20/2012
  10. Quality Measurement: Effects of Screw-Thread Geometry 10/01/2005
© 2010 BNP Media. All rights reserved. | Privacy Policy