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The 2009 Conference theme is "Metrology's Impact on Global Trade." Share your related metrological experiences, the results of your hard work on a committee, or specialized measurement techniques you have developed. This opportunity gives you a chance to speak to, and become known by, your peers all over the world.
Abstracts at all levels of metrology and calibration are accepted for peer review. If your paper is selected, it will become part of the conference proceedings.
Send abstract of 350 words or less to CallForPapers@ncsli.org no later than January 18, 2009. Include contact information and a short bio.
A greatly reduced conference registration price of $250 will be granted to those who submit their abstract by January 18, 2009, and their paper by May 22, 2009.
Visit ncsli.org for more information.