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Metrology professionals are invited to submit a 500-word abstract for presentations and technical papers covering industry best practices, scientific research and developments, and successful applications of 3-D coordinate measurement systems. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.
Abstract submissions will be peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2011. The deadline for abstracts is March 1, 2011. To submit an abstract for CMSC 2011, e-mail Michael Raphael, Technical Presentations Coordinator email@example.com Guidelines for presentations and technical papers can be downloaded at 2011 CMSC Guidelines.