Measurement / New Products

Optical Metrology

September 2, 2009
/ Print / Reprints /
/ Text Size+

The MarSurf WS 1 optical surface metrology system uses white light interferometry to achieve vertical resolution of 0.1 nanometer and provide 3-D measurement. Using MarSurf XT 20 topographical evaluation software, the system can be configured to work both in the lab and on the shop floor. The system’s white light optical sensor enables rapid, high-precision recording of surface topography on a range of materials.

Using white light and a charge-coupled device (CCD) camera, the system is able to collect height information through the field of view of the camera. Both the test surface area and a reference surface built into the objective lens are imaged simultaneously by the camera. During measurement, the Mirau objective is moved in small steps in the Z direction, using a piezo positioner. The resultant interferograms are recorded as image stacks and converted into height data.

Mahr Federal Inc.
(800) 333-4243

Did you enjoy this article? Click here to subscribe to Quality Magazine. 

You must login or register in order to post a comment.




Charles J. Hellier has been active in the technology of nondestructive testing and related quality and inspection fields since 1957. Here he talks with Quality's managing editor, Michelle Bangert, about the importance of training.
More Podcasts

Quality Magazine


2014 December

Check out the December 2014 edition of Quality Magazine for features!

Table Of Contents Subscribe

The Skills Gap

What is the key to solving the so-called skills gap in the quality industry?
View Results Poll Archive

Clear Seas Research

qcast_ClearSeas_logo.gifWith access to over one million professionals and more than 60 industry-specific publications,Clear Seas Research offers relevant insights from those who know your industry best. Let us customize a market research solution that exceeds your marketing goals.


facebook_40.png twitter_40px.png  youtube_40px.pnglinkedin_40px.png