- THE MAGAZINE
- WEB EXCLUSIVES
The 28th annual event will be held at The Roosevelt New Orleans in New Orleans, LA from July 16 – 20, 2012.
The organization welcomes abstracts for presentations and technical papers submitted by metrology professionals from manufacturers, science laboratories and academia. Suggested topics include industry best practices, scientific research and developments, and successful applications of 3-D coordinate measurement systems. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.
Abstract submissions will be peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2012. Notification of acceptance will occur on March 15, 2012. For guidelines or more information about presenting a technical paper at CMSC 2012, contact Michael Raphael, technical presentations coordinator at firstname.lastname@example.org .
The CMS Executive Committee will review all technical papers presented at the CMSC, and select the conference’s best papers for publication in The Journal of the CMSC.