2012 CMS Conference Heads to New Orleans
Attendees are quality professionals -- both expert and novice metrologists who want to expand their skill sets and knowledge- and manufacturing executives, scientists, students and teachers. Online attendee registration is now open at https://www.cmsc.org/register .
Conference details for exhibitors can be found at https://www.cmsc.org/cmsc-exhibitor-information .
The CMSC is the place to rub elbows with experts, hobnob with speakers and make new connections with leaders at the forefront of emerging measurement and inspection trends. The conference always offers a full slate of technical paper presentations covering best practices in diverse metrology applications. But the CMSC agenda also includes measurement studies, workshops, standards seminars, user group meetings and networking opportunities.
Lastly, attendees get to see what’s new first hand in the CMSC Exhibitor Hall featuring portable measurement systems (PCMMs), software, accessories, peripherals and inspection and measurement services. PCMM technology displayed at the conference includes industrial photogrammetry solutions, laser trackers, laser radars, articulating arms, GPS systems, laser scanners, laser projection systems and theodolites.
Call for Papers Continues through March 1, 2012
The CMS “Call for Papers” for the 2012 CMSC continues until March 1, 2012. Abstract submissions are peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2012. Notification of acceptance will occur on March 15, 2012. For guidelines or more information about presenting a technical paper at CMSC 2012, contact Michael Raphael, technical presentations coordinator at email@example.com .
Guidelines for presentations and technical papers can be downloaded at 2012 CMSC Guidelines . Conference speakers gain recognition as industry experts, and all accepted white papers are peer reviewed and considered for publication in the Journal of the CMSC.