Aspectrics Receives its Fifth U.S. Patent
Aspectrics' EP-IR technology enables real-time, parts-per-billion monitoring of dozens of chemical components under hostile environmental conditions commonly found in industrial processes. Applications under development by Aspectrics' OEM customers using its EP-IR technology include ambient air and stack gas monitoring, engine emission analysis, foods and semiconductor processes.
At the heart of Aspectrics' EP-IR analyzer is a rotating disc onto which up to 256 concentric encoding tracks are used to encode dispersed radiation, which is then collected and imaged onto a single-channel detector. The compact design enables very precise intensity measurements under hostile environmental conditions, which enables EP-IR to replace conventional analyzer technologies such as NDIR and FTIR currently used in many process monitoring and control applications.
The new patent number 6,982,788 was filed May 29, 2000, and issued January 3, 2006.
Aspectrics continues to file additional patent applications covering its fundamental technology for recent improvements and variations on the various systems; additional markets where the company may most effectively leverage its technology; and those features most often requested by its customers. The company has dozens of patent applications currently pending and will bolster its portfolio with further filings from its intellectual property counsel Fenwick & West.