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Benbrook, TX –The Coordinate Metrology Society (CMS) announced it has filled all twenty-seven speaker slots at the 2013 Coordinate Metrology Systems Conference (CMSC) being held from July 22 - 26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego, CA. Each year, the event attracts hundreds of 3D measurement inspection professionals and scientists from around the globe. CMSC is known for its high-caliber technical presentations. It is also known for its educational atmosphere where attendees and exhibitors share expertise, ideas, concepts, and theory during this 5-day event. Register for the event at CMSC Registration.
The CMS peer-reviewed abstract submissions and selected 27 technical papers from metrology experts and scientists from leading companies and organizations such as The Boeing Company, Lockheed Martin, BMW, NIST, National Propulsion Laboratory (NPL-UK), 8tree (Germany), Variation Reduction Solutions, Inc., Coast Composites, Electroimpact, ISRO Satellite Centre, and Fermi National Accelerator Laboratory. The roster also includes speakers from prestigious educational institutions including the University of North Carolina, the University of Ontario Institute of Technology (Canada), the University of Manchester (UK) , and the University of Bath, (UK).
The 2013 CMSC presentations cover a diversity of technical subjects related to 3D metrology, including trends, techniques, and technology. Presentation topics range from a “Fully Automated Non-Contact Full Body Inspection Cell at BMW” to “Metrology for Composite Tool Building.” The roster also includes successful applications of laser trackers, photogrammetry, articulating arms, laser radar, 3D scanning and sensors, and more. The CMSC 2013 presentation agenda can be found at the 2013 CMSC Presenters web page.
The CMSC conference lineup includes the first Level-1 Certification examinations, a new Measurement Study, hands-on workshops, and networking events. The Exhibition Hall is packed with portable measurement systems (PCMMs), software, accessories, and peripherals supported by OEMs and service providers fulfilling the needs of the industrial measurement marketplace.