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Renishaw’s new SFP1 probe option for the REVO® five-axis measurement system is the first to allow surface finish inspection to be fully integrated within coordinate measurement routines. With a measurement capability of 6.3 to 0.05 Ra, the SFP1 surface finish probe makes the CMM a “single platform” metrology system. It eliminates the need for hand-held surface measurement devices or transporting parts to a dedicated surface measuring machine, reducing labor costs and inspection lead times.