Quality Magazine

nJuran CEO to Deliver Quality Keynote

March 1, 2005

NORWALK, CT-Joseph De Feo, president and CEO of Juran Institute Inc., will deliver the keynote address at Quality Expo. This year Quality Expo, the event and conference focused on quality-related technologies and solutions for manufacturers, will take place April 19 to 21 at the Donald E. Stephens Convention Center, Rosemont, IL.

Scheduled to speak on the morning of Tuesday, April 19, De Feo will discuss the steps needed to achieve quality leadership in the marketplace, financial stability, growth and a competitive advantage. De Feo has many years of experience in quality management, Six Sigma deployment, strategic quality planning and business improvement methodologies.

De Feo is co-author of Juran Institute's Six Sigma: Breakthrough and Beyond. The book, published in October 2003, is a management resource that presents the philosophy and methodology of the Juran Institute, with the goal of helping managers move beyond initial Six Sigma efforts and achieve sustainable bottom-line results.

De Feo, who earned his MBA from Western Connecticut State University, is a regular speaker at conferences and events, bringing his knowledge of working with clients in a variety of industries including consumer products, electronics, chemical processing, aerospace, automotive and semiconductors. He has served as an adjunct professor of Global Competitive Quality Management at Central Connecticut State University, in addition to being a guest lecturer at Columbia and New York Universities.

"[De Feo] is recognized for his training and consulting expertise in sustaining breakthrough results within many different organizations worldwide. The knowledge and insight he will impart during the address will certainly be of great interest and value to all attendees," says Joe McGeachy, event director for the Quality Expo events.