Quality Magazine

Measurement Conference to Feature Dimensional Metrology

December 1, 2003
For the first time, the Measurement Science Conference, scheduled for Jan. 24, in Anaheim, CA, will run a dimensional metrology track and will feature tutorials and seminars.

ANAHEIM, CA-For the first time, the Measurement Science Conference (MSC), scheduled for Jan. 24, in Anaheim, CA, will run a dimensional metrology track and will feature tutorials and seminars.

In the past, the conference has focused on other areas of metrology such as time and frequency, mass and electronics. This year, the conference has included dimensional metrology into the program and recruited Dr. Jim Salsbury of Mitutoyo America (Aurora, IL) to organize the sessions.

The dimensional metrology tract includes two half-day tutorials on Jan. 14, and three technical sessions featuring three speakers speaking on three different topics. Those sessions are held on Jan. 15 and 16. The tutorials include: "Thread Metrology," presented by Eric Johnson of Johnson Gage Co. (Bloomfield, CT) and "Performance of CMMs: Testing, Calibration and Uncertainty," presented by Salsbury.

The technical sessions include a Jan. 15 track on practial dimensional metrology and will look at "Laser Tracker Measurements of Submarine Launch Tubes," "Inspection of Large Caliper Gun Barrels," and "Calibration of Glass Scales."

A second track, also held on Jan. 15, will present a "Report on the National Measurement Requirements Meeting," "New Capabilities at NIST in Dimensional Metrology," and "High Precision Dimensional Calibrations."

On Jan. 16, there will be an update on dimensional standards, including: "The New Gage Block Standard," "Recent Activities in Dimensional Standards," and "New Standards and Techniques for Testing CMM Software, ASME B89.410 and ISO 10360-6."

For more information, visit the conference's Web site at www.msc-conf.com.