The Coordinate Metrology Systems Conference (CMSC) 2010 will be held in Reno, NV, July 12-16. The international five-day event provides a professional venue where ideas, concepts and theory flow freely amongst participants. The open, educational atmosphere allows attendees to network and learn about the latest innovations in the field of portable 3-D industrial measurement technologies.
World-leading manufacturers and science laboratories come together each year to deliver application-oriented presentations about their use of high-end metrology solutions.
Also slated for CMSC are advanced workshops and an exhibition hall packed with technology and service providers.
For more information visit www.cmsc.org