A 'Quality-Filled' Metrology Conference Track
July 27, 2010
If you have a vision, as in having a fail-proof metrology plan for your company, then attending the Metrology Conference Track during IMTS 2010 is sure to help that vision become a reality. Presentations from five different industry veterans will help identify issues companies face with their metrology systems and how best to address them in order to catch part defects.
Presenters include Joe Freud, executive vice president, KSolutions; Sam Golan, president/CEO, PAS Technology; Tom Groff, sales manager, Optical Gaging Products (OGP); Dr. Heinrich Schwenke, co-founder and CEO, Etalon AG; and Paul Hogendoorn, president and co-founder, OES Inc.
As a sampling of the presentations offered through the IMTS 2010 Industry & Technology Conference, Groff will look at multi-sensor metrology, providing an overview of the various sensors used to measure a variety of dimensions of manufactured parts, and best practices for the use of each sensor. This presentation is on Tuesday, September 14, from 11:00 a.m. to 11:55 a.m.
Golan delivers “CAD/CMM, A New Category in the CMM Industry” on Thursday, September 16, from 11:00 a.m. to 11:55 a.m., that will discuss domestic and global industry challenges, trends, current solutions, CMM needs - such as standardization, automation, and collaboration, as well as case studies for review.
Find out more about the IMTS 2010 Industry & Technology Conference and register today. A conference pass includes access to the exhibit hall floor for all 6 days of the show, breakfast and lunch, and Industry Inspiration Day and Keynote Luncheon on Monday, September 13.