Jeff Gust, Fluke Chief Corporate Metrologist, Wins the 2011 Woodington Award
May 3, 2011
EVERETT, WA- Jeff Gust, Chief Corporate Metrologist for Fluke Corp., has been named the recipient of the 2011 Woodington Award by the Measurement Science Conference (MSC). The annual award, which is sponsored as a memorial to the late Andrew J. Woodington, recognizes a member of the measurement community who represents the highest level of professionalism and dedication to the metrology profession.
The announcement was made at MSC's annual conference held in Pasadena, CA.
Gust, who joined Fluke Calibration in 2010, was honored for his 25-year career in metrology and calibration, including primary standard level contributions to DC/LF, RF, fiber optics, time and frequency, pressure, temperature, dimensional, and mechanical metrology.
Gust earned his bachelor's degree in physics from Purdue University and is a writing member for development of the ISO 17043 standard, which specifies general requirements for the competence of providers of proficiency testing schemes and for the development and operation of proficiency testing schemes.
Gust founded of MeasurePT Inc., an accredited proficiency testing provider for calibration and test laboratories; is co-author of three National Institute of Standards and Technology articles; a past president of NCSL International, the author of numerous metrology papers; and regularly teaches tutorials on proficiency testing and measurement uncertainty.