Quality Magazine

CMS Announces Interactive Measurement Study

June 15, 2011

BENBROOK, TX-The Coordinate Metrology Society (CMS) will conduct a large-scale, interactive measurement study during the 27th annual Coordinate Metrology Systems Conference (CMSC), July 25 – 29, at the Arizona Biltmore Hotel and Spa, Phoenix, AZ. The study, titled “How Behaviors Impact Your Measurement” will be coordinated by the National Physical Laboratory (UK), and assisted by members of the CMS Certification Committee. All attendees will be encouraged to participate in daily data collection activity, which will provide hands-on experience with large volume measurement systems. Participants will perform a series of prescribed measurements using measurement systems provided by ATT Metrology Service, a subsidiary of study sponsor Metrologic Group. Each participant will be asked to provide information on their level of experience and background in metrology. The purpose of the workshop is to explore the measurement strategies and behaviors of coordinate metrologists.

A special CMSC workshop focused on the results of the measurement study will be held at 2:30pm, on Thursday, July 28, 2011. Data collected during the first three days of the conference will be compiled, and then examined for measurement variability. The outcome will be presented by the National Physical Laboratory. The criteria of the measurement tasks will enable various training and assessments techniques to be analyzed, such as the evaluation of prior learning and experience, questioning techniques and practical task monitoring and demonstration.

This new study is based on the success of last year’s mock gauge R&R study that attracted an overwhelming majority of 2010 CMSC attendees expressing enthusiasm for the experience in both the conference feedback session and a post conference survey. The CMSC 2011 agenda includes three other Technical Workshops during the week including a 3D Metrology Hardware Review, a CMS Certification Committee Update, and a look at GD&T Software as applied to 3D Scan Data. Technical white paper presentations, an Exhibition Hall, and networking events round out the Conference.