Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
April 3, 2012
TUCSON, AZ-Bruker Nano Surfaces Division has shipped 100 DektakXT Stylus Surface Profiling System since the product launched last April. The DektakXT features improved ease of use and step height repeatability of better than 5 angstroms, 1 sigma. The DektakXT monitors thin film deposition and etch systems in solar, FPD, HBLED, and semiconductor research.