Quality Magazine

Registration Now Open for 2012 National Instruments Technical Symposium

August 30, 2012

AUSTIN, TX--National Instruments announces open registration for the 2012 NI Technical Symposium , a series of day-long events that showcase the latest NI technologies and development techniques for engineers and scientists working with measurement and automation systems. Using a graphical system design approach and NI tools, engineers can integrate real-world signals sooner for earlier error detection, reuse code for maximum efficiency and benefit immediately from advances in computing technology.

The program includes a morning keynote and more than a dozen technical sessions tailored for each city to help engineers accelerate development and optimize solutions for size, performance and cost.

Attendees of all experience levels can select sessions that meet their needs and discuss development and test challenges with NI experts and Alliance Partners.
Session highlights include:
  • Introduction to NI LabVIEW 2012 ;
  • 10 Functions in NI-DAQmx That Can Perform 80 Percent of Data Acquisition Tasks ;
  • RF Vector Signal Analyzer Techniques With PXI Modular Instrumentation ;
  • Effectively Deploying, Replicating and Managing Real-Time and FPGA Applications ; and
  • Hands-On Introduction to NI CompactRIO for Embedded Measurement and Control.

    Registration is complimentary and open to the public. Learn more and register for the NI Technical Symposium at www.ni.com/techsym .