Quality Magazine

X-Ray measurement

August 13, 2007
The HMX handheld XRF film thickness and composition analysis measurement tool is suited to the needs of the fastener, connector and general metal finishing industries. The unit’s measurement capabilities include at-process measurement for quality control, plating line and analysis lab applications, and at-sample analysis in the factory or in the field along with alloy sorting and alloy identification for substrate materials management. The Batch Measurement mode lets the operator calculate the average thickness of a batch of small parts with a single measurement. Point and shoot and the analyzer automatically generates an average thickness for the entire lot. In addition, the unit is an XRF solution for measurement of large samples that commonly cannot be measured in chamber-based systems because of part size.

Matrix Metrologies Inc.
(631) 472-2400
www.matrixmetrologies.com
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