Quality Magazine

PerkinElmer Optoelectronics Introduces New Digital X-ray Detectors

October 31, 2008

SHANGHAI - PerkinElmer Optoelectronics announced its new high-speed, high-throughput, digital X-ray detectors will be on display for the first time at next week in Shanghai, China.

Ideal for applications including pipeline inspection, metal casting inspection, composite materials inspection, PCB testing, and in-line manufacturing inspection, the new amorphous silicon digital x-ray detectors offer twice the output speed of previous designs. With high resolution and the ability to produce real-time images, the detectors are radiation-hardened and designed to withstand the demanding, high energy test environments found in 24x7 production lines.

This will mark PerkinElmer’s first exhibition in Asia of its digital imaging technologies for a range of industrial applications. These technologies are an integral part of the company’s ongoing commitment to supporting health and environmental infrastructures in China. To date, PerkinElmer has delivered more than 15,000 X-ray detectors worldwide and is able to support the needs of an expanding global market through its manufacturing facilities.