The right choice of inspection hardware and software for Computer-Aided Inspection (CAI) can reduce inspection times by up to 90% while improving repeatability and reproducibility (R&R) variances by up to 50%.
First Examinations to be held at 2013 Coordinate Metrology Systems Conference
April 23, 2013
The Coordinate Metrology Society (CMS) launched the industry’s first Level-One Certification for Portable 3D Metrology. The first examinations will be held at the 29th annual Coordinate Metrology Systems Conference (CMSC), July 22 – 26, 2013.