Geoff Anderson

Geoff Anderson is senior project manager, profilers, at Veeco Instruments Inc. (Tucson, AZ). For more information, e-mail or visit


Quality measurement: Surface Metrology Tools Support Quality Needs

Quantitative measurement of surface topography is now a key QC/QA requirement in an increasingly broad range of industries, products and materials. This includes measurements on finished products, research and development (R&D) into new surfaces and surface treatments and in-process monitoring during volume production. Materials include metals, composites, plastics, paper, painted and plated surfaces, porous surfaces and glass. Drivers for these measurements range from critical functional and performance impact, as in the case of a partially processed semiconductor wafer surface, to expected lifetime, such as for hip implant bearing surfaces, to aesthetic considerations, an example being orange peel in automotive paint.
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Karen Spencer, Clinkenbeard's quality manager, discusses what makes the plant stand out, advice for other plants, and looks to the future.
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Quality Magazine


2015 May

The May 2015 edition of Quality Magazine includes articles on cloud technologies, depth gages, ISO 9001, digital inspection and cool new products.

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