Articles by Brian J. Bierman

Solve Common Industrial Problems with Automated SEM Analyses

The newest generation of scanning electron microscopes (SEM) utilizing energy dispersive X-ray spectrometers (EDS) include computer automation that allows for rapid elemental analyses of small particles or inclusions. Automated analysis yields chemical and morphological information on large numbers of particles or inclusions, which can be used to identify specific populations of materials present within a sample. Automated SEM analysis eliminates operator subjectivity inherent in time-intensive manual SEM or optical characterization techniques.
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Karen Spencer, Clinkenbeard's quality manager, discusses what makes the plant stand out, advice for other plants, and looks to the future.
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Quality Magazine


2015 May

The May 2015 edition of Quality Magazine includes articles on cloud technologies, depth gages, ISO 9001, digital inspection and cool new products.

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