Articles by Brian J. Bierman

Solve Common Industrial Problems with Automated SEM Analyses

By Brian J. Bierman
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The newest generation of scanning electron microscopes (SEM) utilizing energy dispersive X-ray spectrometers (EDS) include computer automation that allows for rapid elemental analyses of small particles or inclusions. Automated analysis yields chemical and morphological information on large numbers of particles or inclusions, which can be used to identify specific populations of materials present within a sample. Automated SEM analysis eliminates operator subjectivity inherent in time-intensive manual SEM or optical characterization techniques.
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For more information, read the ASQ Speaking of Quality column.
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