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Articles by Francois Blateyron
For a long time surface metrology has been based upon measurement using 2D profilometers. Over the past twenty years the appearance of 3D profilometers and non-contact gauges has created a need for the standardization and formalization of the analysis of 3D surface texture. This paper presents the current status of the standardization process and includes a short description of the tools and parameters that will become available to users when work on the definition of the new standards, which is being carried out by working groups WG15 and WG16 of ISO technical committee TC213, has been completed.
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