René Sicard

René Sicard is the R&D manager of TecScan Systems Inc. (Boucherville, Quebec, Canada). For more information, call (450) 641-5876, e-mail info@tecscan.ca or visit www.tecscan.ca.

ARTICLES

Take a Closer Look at Ultrasonic Inspection

March 30, 2010
In the context of ultrasonic inspection, contour following is a scanner’s ability to do a controlled displacement of one or multiple axes.
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Optimize Synthetic Aperture Focusing

August 1, 2006
Advanced signal analysis techniques assist ultrasonic testing to maximize the information collected.
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 In honor of World Quality Month, we spoke to James Rooney, ASQ Past Chairman of the Board of Directors 2013, for his take on quality around the world.
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