Quality Blog

Computed Tomography in Metrology—Don’t Miss this Webinar

October 23, 2012

IMTS 2012 was a success for Quality in several ways, not least of which was its live webinar on Tuesday, Sept. 11, with Marcin B. Bauza, director, New Technology and Innovation, Carl Zeiss Industrial Metrology, LLC.An audience gathered to listen to Bauza discuss the nuances and complexities of Computed Tomography (CT). Now on Tuesday, Oct. 30th, at 2 p.m. EDT, you will have another chance to hear the webinar presented live.

This webinar will decipher CT applications; differences in nondestructive testing and metrological CT systems; image creation mechanics in 3-D  X-ray and its limitations; the future of the technology, and more. As the increasing resolution of digital detectors over the past decade has ultimately given rise to much more precise measurement readings, CT has become much more prominent.

Be sure to register for this webinar, and if you can’t make  it, view it on-demand.




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