What: FREE webinar
Where: Right from your computer
Duration: 60 minutes

Computed Tomography in Metrology

During the last decade Computed Tomography (CT) has become more applicable to metrology since the resolution of the digital detectors was increased allowing a micrometer level of true resolution in measurements. Since metrological applications require accuracy statement, a much different approach than for typical non-destructive CT system is required. A quantitative analysis requires a high fidelity of measurement process, long term stability and repeatability, therefore the metrological CT has to be designed with metrological principles and treated as CMM with CT sensor rather than 3D imaging unit. It is relatively easy to produce a 3D image of a part; however, it is required to use metrological CT to produce a 3D image which will provide undistorted and up to scale representation of external as well as internal features.
 

1. Image creation mechanics in 3D x-ray and its limitations
2. The differences between a non-destructive testing CT and metrological CT system
3. Proper testing of metrological aspects of CT system
4. Possible CT applications in metrology - examples.
5. Future of CT systems

Can't attend live? Register to view the webinar on-demand!

	Speaker: Marcin B. Bauza Director New Technology & Innovation Carl Zeiss Industrial Metrology, LLC