Advanced signal analysis techniques assist ultrasonic testing to maximize the information collected.
Ultrasonic testing of materials can be done in several ways using different types of instruments, ranging from thickness gages for localized measurements to multi-axis automated C-Scan scanners for imaging of complex parts. While these instruments can satisfy the needs of most applications, some situations require advanced signal analysis techniques in order to maximize the information collected from the tested structure.
One of the problems related to structure inspection is the correct identification of the ultrasonic echoes and time-of-flight related to defects. Differentiating between echoes from defects and from the nondefected surrounding areas of the material can be challenging, particularly when complex geometries are involved. In addition, time-of-flight or phase information of a single echo produced by a defect is usually insufficient to correctly determine the origin of this echo in space, and completing defect sizing is impossible. However, multiple echoes acquired from different probe locations along with numeric or synthetic focusing could contain enough information to localize defects in materials and display clearer cross-sectional B-scans and full C-Scan images.