Starrett To Present the Versatility of 'Walk-Up Metrology' at IMTS Conference Sessions
ATHOL, MA — Starrett announced that Mark Arenal, general manager of its subsidiary Starrett Kinemetric Engineering Inc., will present "How Walk-Up Metrology Offers QC Versatility from Manual One-Feature Measurements to Semi-Automated Multi-Dimensional Testing" at 11 a.m. Sept. 11 in room W192-B during IMTS at McCormick Place in Chicago.
The presentation will discuss Walk-Up Metrology—the capability and utilization of a vision and multi-sensor system to be effective for a wide range of measurement applications. Applications can range from simple manual measurements of one feature, to measuring many features on multiple parts in a semi-automated fashion.