The Coordinate Metrology Society (CMS) announced the official call for technical papers for their Coordinate Metrology Society Conference (CMSC) to be held July 20 – 24, 2020 in New Orleans, LA. In its 36th year, the CMS will again host an interactive educational conference for novice and expert users of portable and stationary measurement solutions. For the first time, abstract submissions will be accepted from experts working in the traditional CMM field, in addition to master practitioners from the portable metrology discipline. Commercial content is not accepted. The CMS community convenes each year to learn about breakthroughs in measurement technologies and emerging trends impacting manufacturing, scientific research, and data-driven quality platforms.
The CMS conference is designed to provide attendees with thought-provoking technical presentations and open discussions of advancements in 3D metrology applications. Subject matter experts and expert teams are encouraged to submit abstracts covering original research, best practices, technology benchmarks, successful implementations, data-driven Smart Factory trends and metrology-assisted competencies gained in automation, process control, and assembly. Overall, the CMSC delivers an inclusive knowledge platform to engage professionals at different skill levels, as metrology continues to dramatically impact the entire manufacturing landscape.