Nikon Metrology has made a number of improvements to its new, 225 kV, microfocus X-ray CT (computed tomography) system, the XT H 225 ST 2x. Two of the features are not to be found on any other industrial CT system. One is Rotating.Target 2.0, which thanks to more efficient cooling enables a 3x smaller focal spot size for clearer imaging. The other, Half.Turn CT, is a novel method for almost halving the angle through which a specimen rotates during the X-ray cycle, speeding the process without loss of image quality.
Operation has been greatly simplified and efficiency doubled, enhancing the system's suitability for a wide range of applications from the museum laboratory through academia to the R&D department and on to the factory floor. The intrinsic benefit of X-ray CT is that it allows both the exterior and interior of a sample to be inspected and measured non-destructively. The XT H 225 ST 2x, which has undergone thousands of hours of rigorous testing, is distinguished by its ability to be tuned to match the part under investigation so that optimal results are produced every time.