The Eclipse MA200 is an inverted materials microscope designed for digital imaging and operator ergonomics. The microscope uses integrated intelligence to automatically combine captured images with data on their observation settings for more comprehensive documentation. Additionally, its box design allows easy access to the sample on the stage and nosepiece, while making the footprint size one-third of the conventional model.
The 1X objective lens enables macro observation with actual field of view of 25 millimeters, making it possible to view the whole area of an embedded metallurgical sample. In addition, it offers a range of contrast methods including episcopic bright field, episcopic dark field, differential interference contrast microscopy (DIC), simple polarizing and episcopic fluorescence.
Nikon Instruments Inc.