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The CMS has accepted technical papers from metrology experts and scientists from The Boeing Company, Lockheed Martin, Rolls-Royce, NIST, Argonne National Laboratory, National Research Council Canada, Hitachi Engineering and Services Company, Northrop Grumman, US Army Research Laboratory, US Navy, Clemson University, Purdue University, Electroimpact Inc., Institute of Measurement and Automatic Control at Leibniz Universität, ISRO Satellite Centre, Schneider-Electric, and more.
CMSC presentations will cover a diversity of subject matter related to 3-D metrology, including trends, techniques, and technology. Presentation topics range from “Curing Cancer with Metrology” to “Optical Metrology Guidance for Precision Robotic Machining of Composites”. The roster will also include successful applications of photogrammetry, laser trackers, articulating arms, laser radar, 3-D scanners, 3-D vision systems and more. A full listing of the CMSC 2012 presentations can be found at 2012 CMSC Presenters.
The CMSC conference lineup includes a new measurement study, workshops, networking events and an exhibition hall featuring portable measurement systems (PCMMs), software, accessories, peripherals, and service providers servicing the needs of the industrial measurement marketplace. The CMS Certification Committee will also host a series of “pilot” certification examinations open to all registered attendees and exhibitors.