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"Bruker is pleased to have again been recognized by the R&D 100 award committee," says Mark R. Munch, Ph.D., president of the Bruker Nano Surfaces division. "Prior to this year, instrumentation developed at our facilities has earned seven additional R&D 100 Awards, including four for optical metrology and three for atomic force microscopy. We are gratified that with AcuityXR we can provide our customers with previously unattainable optical metrology performance, and look very much forward to the innovations they will accomplish with these new capabilities."