EDAX, Inc. has introduced new APEX Analysis software for its Element SDD silicon drift detector for tabletop scanning electron microscopes (SEMs), a product line focused on serving the needs of the industrial market.
The APEX software package for Element was developed with a primary focus on industrial needs and ensures high-end results, combined with ease of use. Built on fundamentally new quantification algorithms, APEX accelerates and simplifies compositional analysis and delivers high-quality data processing with accurate and reliable results.