Dr. Mike Conroy

Dr. Mike Conroy is business development manager, noncontact metrology for Ametek Taylor Hobson (Leicester, England). For more information, call +44 (0)116 246 3171, e-mail mike.conroy@ametek.co.uk or visit www.taylor-hobson.com.

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Interferometry Advances the Measurement of MEMS

The study of micro and nano surface metrology is becoming commonplace in industrial and research environments as structures and surface features become smaller and smaller. One area where this is evident is the expansion of interest in noncontact metrology for measurement of different types of microelectromechanical systems (MEMS) structure.
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Karen Spencer, Clinkenbeard's quality manager, discusses what makes the plant stand out, advice for other plants, and looks to the future.
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2015 May

The May 2015 edition of Quality Magazine includes articles on cloud technologies, depth gages, ISO 9001, digital inspection and cool new products.

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