NASHVILLE, TN-A call for papers has been issued for the 2005 International Dimensional Workshop (IDW, www.qualitymag.com/idw). The workshop, which takes place May 9 to 13, at the Gaylord Opryland Hotel in Nashville, TN, will have a dual theme. The theme for May 10 is Dimensional Measurement Issues and Strategies and the theme for May 11 is Multi-Sensor Metrology Platforms.
Title and abstract are due by December 17. Authors will be notified by January 7, 2005, if their paper is selected.