Carl Zeiss Launches Photo Competition for Electron Microscopy
“Fascinating electron microscope images are sitting around in numerous archives without an opportunity for recognition. With this competition, we want to give users of our systems an innovative platform to present their images and the underlying work to the public,” explains Dr. Peter Fruhstorfer, member of the management board of the Nano Technology Systems Division at Carl Zeiss.
A picture says more than a thousand words. And images taken with electron and Ion microscopes frequently provide unique insights into the specimens and lead to new scientific-technical knowledge. At the same time, these images often feature outstanding aesthetic properties. “We are already anxiously awaiting your images,” adds Fruhstorfer.
Any images not more than two years old that were taken using particle beam systems from Carl Zeiss are eligible. Images can be entered in any of four categories: SEM, TEM, CrossBeam (FIB-SEM) and Helium-Ion Microscopy. The image that receives the best score in each category will be honored with a cinemizer PLUS 3D video viewer from Carl Zeiss. The contest website is open to anyone that wants to view and assess the submitted images, whether they have submitted an image or not. For more information, click here.