- THE MAGAZINE
- WEB EXCLUSIVES
Surface metrology is rapidly growing field of research because objects interact with each other at their surfaces, and knowing the exact nature of those interactions can affect our understanding of such diverse phenomena as the way a medical device acts within the human body; the way paint adheres to a car; how a coating makes a pill easier to swallow; or whether a new kind of solar panel will be effective at gathering light.
"This meeting will help attendees deepen their understanding of surface metrology and enhance their work in a wide variety of disciplines ranging from design engineering and manufacturing to anthropology, archaeology and forensics," said Chris Brown, Ph.D., a professor at WPI, director of its Surface Metrology Laboratory and a co-chair of the seminar.
Among the nearly two dozen presenters will be Dr. Adrian A. Evans, research associate, AGES, School of Life Sciences, University of Bradford, UK, who will talk about the use of laser scanning confocal microscopes for aerial surface measurement and imaging, using the Olympus LEXT 4000 system. Delegates are encouraged to bring their own samples for imaging. No sample preparation is needed and samples can be up to 10 centimeters thick.
In addition to the many talks about a wide variety of issues in surface metrology, seminar will feature daily poster sessions where researchers can share data about methods and applications.
Olympus, whose industrial microscopes and metrology systems play a leading role in precision R&D, engineering and manufacturing applications in fields as diverse as aerospace, the automotive industry, electronics, materials science/metallurgy, medical devices, photovoltaics and semiconductors, is supporting the conference with personnel and advanced technology.
For more information on the WPI International Conference on Surface Metrology, contact David Rideout at Olympus America Inc., 3500 Corporate Parkway, Center Valley, PA 18034-0610 USA; phone (484) 896-5792; email firstname.lastname@example.org; or visit <www.surfacemetrology.org>http://www.surfacemetrology.org/2011.