This x-ray fluorescence (XRF) instrument expands the MicroConnex metrology capability set to include best-in-class thickness and composition measurements of very thin metal coatings, conductive traces, and small components and structures.
Too often users of precision measuring instruments and gages end up with the wrong equipment and don’t find out until it’s too late. ‘Too late’ means after rejects are detected by in-house measurements or in worst case scenarios, by their customer.
Have you ever stepped on a scale to weigh yourself, stepped off the scale, and then stepped back on to measure your weight a second time? Have you ever gotten two different readings?
We’ve all heard the term “practice makes perfect.” It’s something instilled in us from a young age, from the repetition of the alphabet to the memorization of the multiplication table.
As part of a five year, $15 million roll-out investment in technology, Jesse Garant Metrology Center’s latest expansion includes a more diverse range of advanced imaging systems, including industrial CT systems for inspecting large parts and assemblies.