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Home » Events » TIME TO DATA: KEY TO FAST, ACCURATE SURFACE METROLOGY

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TIME TO DATA: KEY TO FAST, ACCURATE SURFACE METROLOGY

9/5/12 2:00 pm to 9/5/13 3:00 pm EST
Online
Contact: Kristin Overbeck

What: FREE webinar
Where: Right from your computer
Duration: 60 minutes, including LIVE Q&A

 

TIME TO DATA: KEY TO FAST, ACCURATE SURFACE METROLOGY


3D optical microscopes are among the most accurate inspection tools available for surface roughness and texture as well as 3D areal topography. Production engineering and QA/QC inspection personnel will obtain tremendous value from high resolution Z measurements, fast, accurate and automated staging for the fastest time to gage-capable metrology.

In this webinar, we will cover basic information about 3D optical microscope technology and present key advantages of these tools for speed and ease of use for optimized time to data. The shortest possible time to data ensures the most stable, accurate and immediate feedback to production and process development users; the benefits of this metrology make optical microscopes the clear choice for many demanding inspection metrology applications.

In this webinar, you will learn:
 

  • 3D optical microscopes offer an excellent non-contact metrology solution with gage capability for production and QA/QC use
  • Benefits of fast data acquisition for production inspection and quality of data
  • Striking a balance between speed and accuracy for optimum information

Can't attend live? Register to view the webinar on-demand!


Speaker:

Matt Novak, Ph.D

Market Applications Development Manager
Bruker Nano Surfaces Division
Register for this Event

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