A new book on information modeling, Information Modeling for Interoperable Dimensional Metrology , has been published by Springer.

This book was written by Dr. Fiona Zhao of the National Institute of Standards and Technology (NIST); Dr. Tom Kramer, also of NIST; Professor Xun Xu of the University of Auckland; and Robert Brown of Mitutoyo America Corp.

“It is our humble opinion that this book breaks ground for our industry and draws from many decades of academic research as well as current trends on the subject,” Brown says.

The book says it will:

  • Give readers an overview and in-depth understanding of a complete dimensional metrology system;
  • Enable readers to utilize basic theories and key technologies to solve the practical dimensional measurement problems in modern dimensional metrology practices; and
  • Allows reader to integrate the information modeling techniques and data models described in the book with their own research work.