Imaging applications using short-wave infrared (SWIR) wavelengths identify unique characteristics of objects that would be otherwise difficult to detect. Visible and near-infrared (NIR) imaging capture light reflecting off objects, while the longer wavelengths of thermal imaging detect the infrared radiation emitting from objects. SWIR wavelengths, on the other hand, capture interesting information between those wavebands. Things that are invisible under white light may become visible, objects that are opaque under white light can become transparent, and contrast may be increased between different materials that would otherwise appear identical (Figure 1).
These traits make SWIR imaging systems powerful tools, but complexities and inefficiencies in SWIR sensors and light sources have resulted in slow adoption in the past. However, advancements in SWIR image sensors and illumination have made these systems more accessible than ever before, opening up a wave of new SWIR applications. But because of the unique ways SWIR wavelengths interact with objects, there are unique considerations when selecting SWIR lighting, cameras, and lenses compared to visible and NIR systems.