Brian J. Bierman

Brian J. Bierman is a senior research scientist at McCrone Associates Inc. (Westmont, IL). For more information, call (630) 887-7100, e-mail bbierman@mccrone.com or visit www.mccroneassociates.com.

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Solve Common Industrial Problems with Automated SEM Analyses

By Brian J. Bierman
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The newest generation of scanning electron microscopes (SEM) utilizing energy dispersive X-ray spectrometers (EDS) include computer automation that allows for rapid elemental analyses of small particles or inclusions. Automated analysis yields chemical and morphological information on large numbers of particles or inclusions, which can be used to identify specific populations of materials present within a sample. Automated SEM analysis eliminates operator subjectivity inherent in time-intensive manual SEM or optical characterization techniques.
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 In honor of World Quality Month, we spoke to James Rooney, ASQ Past Chairman of the Board of Directors 2013, for his take on quality around the world.
For more information, read the ASQ Speaking of Quality column.
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2014 September

Check out the September 2014 edition of Quality Magazine for features!

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