Brian J. Bierman

Brian J. Bierman is a senior research scientist at McCrone Associates Inc. (Westmont, IL). For more information, call (630) 887-7100, e-mail or visit


Solve Common Industrial Problems with Automated SEM Analyses

The newest generation of scanning electron microscopes (SEM) utilizing energy dispersive X-ray spectrometers (EDS) include computer automation that allows for rapid elemental analyses of small particles or inclusions. Automated analysis yields chemical and morphological information on large numbers of particles or inclusions, which can be used to identify specific populations of materials present within a sample. Automated SEM analysis eliminates operator subjectivity inherent in time-intensive manual SEM or optical characterization techniques.
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Charles J. Hellier has been active in the technology of nondestructive testing and related quality and inspection fields since 1957. Here he talks with Quality's managing editor, Michelle Bangert, about the importance of training.
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Quality Magazine


2014 October

Check out the October 2014 edition of Quality Magazine for features!

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The Skills Gap

What is the key to solving the so-called skills gap in the quality industry?
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