Mettler Toledo announced that the next-generation inline PVM tool, ParticleView V19 with PVM technology, is now available. The new in situ probe-based particle vision and measurement tool continuously captures high-resolution images under a wide range of process conditions. ParticleView V19 then automatically prepares a report pairing the most relevant images to data tracking particle size and concentration changes. This compelling blend of high resolution images and trend data helps promote quick, comprehensive particle system understanding for significant productivity enhancements during process design, scale-up, and manufacturing.VideoMicroscope_IN

ParticleView V19’s ability to pair relevant images with trend data means a reduction in the time and effort required to investigate significant process events or upsets. As scientists are able to readily determine the influence of process conditions on particle size and shape, processes can then be designed so particles behave more predictably. Scientists also eliminate the need for cumbersome and sometimes inaccurate offline sampling.

Continuous monitoring with ParticleView V19 offers researchers knowledge on complex particle systems that might otherwise be too time-consuming or expensive to obtain – such as polymorphic transformations, phase separation events and the formation of delicate structures such as flocs, dendrites and droplets. This information can help characterize transient events and elusive mechanisms to augment sound decision-making and further lower process development costs.

Common applications for V19 with PVM technology include understanding crystallization; identifying growth, agglomeration, breakage and shape changes; controlling particle size and shape; monitoring polymorphic transitions; identifying the source of batch-to-batch inconsistencies; optimizing oil/water separations; and viewing particle and droplet systems in locations where offline sampling is not feasible (such as high-pressure lines).

Mettler Toledo