EDAX, Inc. has introduced new APEX Analysis software for its Element SDD silicon drift detector for tabletop scanning electron microscopes (SEMs), a product line focused on serving the needs of the industrial market.

The APEX software package for Element was developed with a primary focus on industrial needs and ensures high-end results, combined with ease of use. Built on fundamentally new quantification algorithms, APEX accelerates and simplifies compositional analysis and delivers high-quality data processing with accurate and reliable results.

With its touchscreen capability, the APEX interface is very user-friendly and can be customized for a specific workflow, offering a wide choice of layouts, colors and data report formats. It has a modular architecture and can be interfaced with external application packages.

The Element SDD delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and easy operation. It offers excellent resolution and market-leading throughput. 

EDAX, Inc.

(201) 529-4880

sue.arnell@ametek.com

www.edax.com