Perceptron to Present at 2011 Quality Conference
The presentation will also cover the history of machine vision and how noncontact metrology has become a common technique used by manufacturers for quality and process control. In manufacturing environments, non-contact metrology has historically been deployed two different ways: in-process gauging or off-line part inspection. Due to cost constraints, most manufacturers have been forced to choose one technique over the other.
In-process gauging is a high speed/low data density approach where the dimensional characteristics of critical discrete features are measured on every part produced, commonly known as 100% inspection. Off-line inspection is typically a low speed/high data density approach where a small sampling of production parts are measured thoroughly using 3-D scanning to assess shape, contours and discrete features.
Recent advances in technology create new opportunities for manufacturers to alter their quality plans and leverage the strengths of in-process gauging and 3-D scanning. More information about the presentation and the 2011 Quality Conference is available here .