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Home » Authors » Xing-Fei He

Articles by Xing-Fei He

Figure 1. AxCIS and conventional cameras
Vision & Sensors | Trends

Innovations Shaping the Future of Contact Image Sensor Technology

High speed, resolution, and dynamic range imaging with true metrology in a compact design
Xing-Fei He
November 26, 2024

Advancements in Contact Image Sensor (CIS) technology are transforming machine vision. They offer high speed, resolution, and a compact design ideal for tight inspection tasks in battery and PCB production lines. With features like high dynamic range and accurate metrology, CIS enhances quality control and efficiency in modern manufacturing.



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Test & Inspection: NIR Line-Scan Imaging

Brad Finney Xing-Fei He Dale Deering
October 1, 2012

Image-processing in the near infrared spectrum is already well established in the photovoltaic industry where it is used in demanding optical inspection procedures that check solar cells for micro-cracks, which can occur during crystal growth and wafer sawing. But this technology has much more to offer and it is gaining in importance in other areas, as this article shows.


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Line-Scan Cameras: Harnessing the Power of High-Performance Line-Scan Cameras

Xing-Fei He
August 23, 2011
Why high-performance, high-speed line-scan cameras are ideal for certain types of applications and how they will perform in these application environments.
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Quality in Color

Xing-Fei He
June 29, 2009
Discover applications for color machine vision, how line scan imaging works and the advantages of tri-linear color line scan cameras for quality inspection.
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