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New Products

Bowman Benchtop XRF Plating Measurement Systems

XRF plating measurement system from Bowman.

XRF plating measurement system from Bowman.

February 1, 2019

Bowman has debuted an important addition to their suite of benchtop XRF plating measurement systems.

Bowman’s G Series XRF is a robust system that’s ideally suited for jewelry, connectors, and other precious metal analysis.  Because it quantifies zinc, zinc-nickel and other anti-corrosion coatings, it is also ideal for components such as fasteners.

The two most distinctive features of the G Series are “bottom-up” measurement using a motorized Z-axis with laser-based auto-focus, and precision video imaging.  An available manual XY stage with 1.5 X 1.5 in. travel facilitates easy positioning of small and large parts.   

The standard G Series configuration includes a single fixed collimator, solid-state PIN detector, and long-life micro-focus x-ray tube. As with all Bowman models, the components can be upgraded to include multiple collimators, a variable focal camera, or an SDD detector.

Like others in the Bowman XRF portfolio, G Series instruments simultaneously measure up to 5 coating layers, 10 elements in each layer, a total of 25 elements in all.  Element range is Al (13) through U (92.)

To quantify coating thickness from the detected photons, G Series systems run advanced Xralizer software.  Xralizer combines intuitive controls with time-saving shortcuts, extensive search capability, and “one-click” reporting.  The software also allows easy creation of new applications by the user.  Equally important: G Series XRFs are full-access instruments from the day of install: there are no dongles or lock-outs to complicate, delay, or add cost.

Bowman’s G Series desktop XRF was developed for quality labs and production environments.  It is highly advantageous for users with limited benchtop space - or budget limitations.  G Series XRFs are ideal for both coating thickness and solution analysis.  

Bowman

(847) 781-3523

www.bowmanxrf.com

KEYWORDS: manufacturing measurement systems quality control XRF analysis

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