Hitachi High-Tech Analytical Science LAB-X5000 Benchtop XRF
Hitachi High-Tech Analytical Science has launched LAB-X5000, the fastest, easiest to use and most versatile model in the 45-year history of the LAB-X. LAB-X5000 is a compact benchtop EDXRF (energy dispersive X-ray fluorescence) analyser with a streamlined user interface and the shortest measurement start sequence on the market, designed to deliver high sample throughput with quality results achieved by any operator. LAB-X5000 has been designed to measure a wide range of materials including petrochemicals, general chemicals, minerals, papers, and films in production environments, testing laboratories and mobile operations.
Inspired by its line of point-and-shoot handheld analyzers, LAB-X5000 offers one-touch operation, requiring minimal input to start an analysis. The operator prepares the sample, loads it into the analysis port and simply pushes the start button, illuminated with a green LED. Results are displayed within seconds and updated throughout analysis, allowing the operator to move to other tasks instead of waiting for the final results. When the measurement is complete, an audible alert gets the operator’s attention. Results are displayed on a large, industrial grade touch screen along with pass/fail indications and SmartCheck messages which can provide instructions on how to handle measurements that may be out of specification. This enables faster decision making to improve production and operational efficiency, thereby saving money.
LAB-X5000 user interface has been designed with a focus on presenting results clearly so operators get the information they need as quickly as possible. The routine analysis screen is 100% dedicated to displaying results; all menus are concealed in a pull-down menu that offers access to powerful features for creating or editing calibrations, investigating unknown materials and managing stored results.
The LAB-X5000 is designed for high-volume testing and includes features that ensure operators spend more time taking measurements and less time maintaining calibrations. Atmospheric compensation using internal monitors automatically and instantly corrects for changes in temperature and pressure that can affect XRF performance. This enables the LAB-X5000 to operate without helium or vacuum purge, reducing operating cost and simplifying instrument setup. The LAB-X5000 periodically and automatically conducts a brief test to validate that the internal analytical components are performing as expected.
It is good practice before measuring samples to verify the performance of the instrument. This is achieved by measuring a quality control check sample using a dedicated function on the LAB-X5000 that prompts the operator to measure a sample and automatically compares results to pre-defined acceptance criteria.
Hitachi High-Tech Analytical Science