JAI introduced the Spark Series SP-25000-CXP4A, a new 26-megapixel high performance industrial area scan camera capable of providing full resolution images at 150 frames per second.
Mitutoyo America Corporation is pleased to announce the release of new EJ Counters and LG100 Series Linear Gages to its expansive sensor lineup of metrology products.
Olympus’ release of its WeldSight™ companion PC software for the OmniScan™ X3 phased array flaw detector provides inspectors with powerful tools to push the boundaries of flaw characterization and sizing.
The new Vanta™ iX in-line X-ray fluorescence (XRF) analyzer automates material analysis and alloy ID on the manufacturing line, delivering instant results for real-time process monitoring and 100% inspection.